SEM and EDS lab:
This lab performs
SEM/EDS described as Scanning Electron Microscopy (SEM) and Energy Dispersive
X-ray Spectrometry (EDS / EDX) for enhanced materials testing and failure
analysis capabilities. The testing laboratory recently purchased a Hitachi
S-3400N SEM and EDAX EDS to provide greater customer convenience and timelier
turnaround than was available with subcontracted services.
The Hitachi SEM
features a variable pressure system capable of accommodating wet and/or
non-conductive samples with minimal preparation. The SEM is able to produce
high resolution images at magnifications from 5x to 300,000x. The large sample
chamber allows for the examination of samples up to 200 mm (7.87 in.) in
diameter and 80 mm (3.14 in.) in height.
ADDED CAPABILITIES OF THE EDS
The EDS component is
applied in conjunction with SEM analysis to detect and measure elements in or
on the surface of the sample for qualitative analysis and/or quantitative
information on a sample’s elemental composition. The new SEM and EDAX EDS
equipment at Laboratory Testing is particularly helpful in microanalysis and
analyzing small areas of interest on samples. The EDAX EDS features a silicon
drift detector (SDD) that offers superior speed and energy resolution compared
with traditional SiLi detectors. The system is powered by the new TEAM software
package that facilitates material characterization via methods such as spectral
analysis, line scans, and element mapping.